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Apr 28, 2024
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CH 8180 - Surface and Thin Film Analysis3 Credits (2 Contact Hours) Fundamental principles underlying the most commonly employed techniques for surface and thin films analysis. Representative techniques include atomic force microscopy, scanning electron microscopy, secondary ion mass spectrometry, Auger electron spectroscopy and Rutherford backscattering. Laboratory exercises give insights into analytical methods. Coreq: CH 8181 .
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